Unsupervised graph-based image clustering for pretext distribution learning in IC assurance

• Main Authors: Tee, Yee Yang, Hong, Xuenong, Cheng, Deruo, Lin, Tong, Shi, Yiqiong, Gwee, Bah Hwee
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2023
• Subjects: Engineering::Electrical and electronic engineering; Hardware Assurance; Feature Extraction
• Online Access: https://hdl.handle.net/10356/171416
• Institution: Nanyang Technological University

Delayered integrated circuit (IC) image analysis is one of the most reliable approaches for the hardware assurance of ICs. Deep learning (DL) techniques have been proposed as an effective means to automate IC image analysis due to their high accuracy and efficiency, allowing for automated learning f...