Study of the mask-less lithography system and its optimization for high resolution pattern of positive photoresist

The research aim is to investigate the optimal resolution of positive lithographic patterns under the 20x lens and the corresponding experimental parameters based on the DMD-based maskless lithography system. The experimental result is examined carefully with the assistance of SEM to check the accur...

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Bibliographic Details
Main Author: Lu, Xiya
Other Authors: Lee Seok Woo
Format: Thesis-Master by Coursework
Language:English
Published: Nanyang Technological University 2024
Subjects:
Online Access:https://hdl.handle.net/10356/178212
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Institution: Nanyang Technological University
Language: English
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