Optimization of metal barrier layers for enhanced SOI-based Ge PIN photodetector performance

This thesis investigates the optimization of titanium disilicide (TiSi₂) as a metal barrier layer for germanium PIN photodetectors on silicon-on-insulator (SOI) substrates to enhance their performance in high-speed optical communication systems. The study highlights the limitations of tantalum ni...

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Bibliographic Details
Main Author: Xu, Hanyuan
Other Authors: Tang Xiaohong
Format: Thesis-Master by Coursework
Language:English
Published: Nanyang Technological University 2025
Subjects:
SOI
TaN
Online Access:https://hdl.handle.net/10356/183095
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Institution: Nanyang Technological University
Language: English
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Summary:This thesis investigates the optimization of titanium disilicide (TiSi₂) as a metal barrier layer for germanium PIN photodetectors on silicon-on-insulator (SOI) substrates to enhance their performance in high-speed optical communication systems. The study highlights the limitations of tantalum nitride (TaN) in high-speed applications and explores the potential of TiSi₂ in reducing contact resistance and improving device efficiency. Using the Design of Experiments (DOE) methodology, the research systematically evaluates the effects of critical process parameters—titanium layer thickness, annealing temperature, and annealing time on the electrical and optical properties of photodetectors have been investigated.