Anisotropic conductive adhesives for micro joining in semiconductor interconnect applications
The main objective in this study was to identify the impact of material properties on reliability, so as to engineer highly reliable microelectronics assemblies.
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2008
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Online Access: | http://hdl.handle.net/10356/2499 |
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sg-ntu-dr.10356-24992023-03-04T00:29:57Z Anisotropic conductive adhesives for micro joining in semiconductor interconnect applications Teo, Mary. Mhaisalkar, Subodh Gautam School of Computer Engineering DRNTU::Engineering::Materials::Material testing and characterization The main objective in this study was to identify the impact of material properties on reliability, so as to engineer highly reliable microelectronics assemblies. Master of Philosophy 2008-09-17T09:04:11Z 2008-09-17T09:04:11Z 2003 2003 Thesis http://hdl.handle.net/10356/2499 Nanyang Technological University application/pdf |
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DRNTU::Engineering::Materials::Material testing and characterization Teo, Mary. Anisotropic conductive adhesives for micro joining in semiconductor interconnect applications |
description |
The main objective in this study was to identify the impact of material properties on reliability, so as to engineer highly reliable microelectronics assemblies. |
author2 |
Mhaisalkar, Subodh Gautam |
author_facet |
Mhaisalkar, Subodh Gautam Teo, Mary. |
format |
Theses and Dissertations |
author |
Teo, Mary. |
author_sort |
Teo, Mary. |
title |
Anisotropic conductive adhesives for micro joining in semiconductor interconnect applications |
title_short |
Anisotropic conductive adhesives for micro joining in semiconductor interconnect applications |
title_full |
Anisotropic conductive adhesives for micro joining in semiconductor interconnect applications |
title_fullStr |
Anisotropic conductive adhesives for micro joining in semiconductor interconnect applications |
title_full_unstemmed |
Anisotropic conductive adhesives for micro joining in semiconductor interconnect applications |
title_sort |
anisotropic conductive adhesives for micro joining in semiconductor interconnect applications |
publishDate |
2008 |
url |
http://hdl.handle.net/10356/2499 |
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1759857217079607296 |