Latchup characterization of submicrometer CMOS

The main purpose of this project is to study the latchup phenomenon in submicrometer CMOS devices and investigate the effects of spike annealing process on latchup sensitivity. Latchup characterization was carried out by a steady-state latchup triggering method.

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Bibliographic Details
Main Author:	Chow, Jane Sze Mun.
Other Authors:	Zhang, Qing
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Online Access:	http://hdl.handle.net/10356/4163
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Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-4163
record_format	dspace
spelling	sg-ntu-dr.10356-41632023-07-04T15:12:45Z Latchup characterization of submicrometer CMOS Chow, Jane Sze Mun. Zhang, Qing School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits The main purpose of this project is to study the latchup phenomenon in submicrometer CMOS devices and investigate the effects of spike annealing process on latchup sensitivity. Latchup characterization was carried out by a steady-state latchup triggering method. Master of Science (Microelectronics) 2008-09-17T09:45:51Z 2008-09-17T09:45:51Z 2003 2003 Thesis http://hdl.handle.net/10356/4163 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits Chow, Jane Sze Mun. Latchup characterization of submicrometer CMOS
description	The main purpose of this project is to study the latchup phenomenon in submicrometer CMOS devices and investigate the effects of spike annealing process on latchup sensitivity. Latchup characterization was carried out by a steady-state latchup triggering method.
author2	Zhang, Qing
author_facet	Zhang, Qing Chow, Jane Sze Mun.
format	Theses and Dissertations
author	Chow, Jane Sze Mun.
author_sort	Chow, Jane Sze Mun.
title	Latchup characterization of submicrometer CMOS
title_short	Latchup characterization of submicrometer CMOS
title_full	Latchup characterization of submicrometer CMOS
title_fullStr	Latchup characterization of submicrometer CMOS
title_full_unstemmed	Latchup characterization of submicrometer CMOS
title_sort	latchup characterization of submicrometer cmos
publishDate	2008
url	http://hdl.handle.net/10356/4163
_version_	1772826264255594496

Latchup characterization of submicrometer CMOS

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