Latchup characterization of submicrometer CMOS

• المؤلف الرئيسي: Chow, Jane Sze Mun.
• مؤلفون آخرون: Zhang, Qing
• التنسيق: Theses and Dissertations
• منشور في: 2008
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/4163
• المؤسسة: Nanyang Technological University

The main purpose of this project is to study the latchup phenomenon in submicrometer CMOS devices and investigate the effects of spike annealing process on latchup sensitivity. Latchup characterization was carried out by a steady-state latchup triggering method.