Latchup characterization of submicrometer CMOS

• Main Author: Chow, Jane Sze Mun.
• Other Authors: Zhang, Qing
• Format: Theses and Dissertations
• Published: 2008
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
• Online Access: http://hdl.handle.net/10356/4163
• Institution: Nanyang Technological University

The main purpose of this project is to study the latchup phenomenon in submicrometer CMOS devices and investigate the effects of spike annealing process on latchup sensitivity. Latchup characterization was carried out by a steady-state latchup triggering method.