Characterization of semiconductor heterostructures
Strain accelerated HF etching is a process which allows for the separation of an intermediate layer in an aqueous acidic solution. The key idea behind this etching method is to induce tensile strain on the material which will subsequently improve the rate of etching. The initial stage of this projec...
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sg-ntu-dr.10356-495502023-07-07T16:45:40Z Characterization of semiconductor heterostructures Wong, Qihao. Yoon Soon Fatt School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Semiconductors Strain accelerated HF etching is a process which allows for the separation of an intermediate layer in an aqueous acidic solution. The key idea behind this etching method is to induce tensile strain on the material which will subsequently improve the rate of etching. The initial stage of this project requires the student to search and purchase an ideal stepper motor which meets the specific requirement to induce sufficient strain on the intermediate layer. Upon purchase, the student has to understand the device and program the device‘s function to meet the requirements of the experiment. On top of that, the student will implement the device into the experiment, and study the effects it has on the results. Bachelor of Engineering 2012-05-21T09:08:35Z 2012-05-21T09:08:35Z 2012 2012 Final Year Project (FYP) http://hdl.handle.net/10356/49550 en Nanyang Technological University 75 p. application/pdf |
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DRNTU::Engineering::Electrical and electronic engineering::Semiconductors Wong, Qihao. Characterization of semiconductor heterostructures |
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Strain accelerated HF etching is a process which allows for the separation of an intermediate layer in an aqueous acidic solution. The key idea behind this etching method is to induce tensile strain on the material which will subsequently improve the rate of etching. The initial stage of this project requires the student to search and purchase an ideal stepper motor which meets the specific requirement to induce sufficient strain on the intermediate layer. Upon purchase, the student has to understand the device and program the device‘s function to meet the requirements of the experiment. On top of that, the student will implement the device into the experiment, and study the effects it has on the results. |
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Yoon Soon Fatt |
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Yoon Soon Fatt Wong, Qihao. |
format |
Final Year Project |
author |
Wong, Qihao. |
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Wong, Qihao. |
title |
Characterization of semiconductor heterostructures |
title_short |
Characterization of semiconductor heterostructures |
title_full |
Characterization of semiconductor heterostructures |
title_fullStr |
Characterization of semiconductor heterostructures |
title_full_unstemmed |
Characterization of semiconductor heterostructures |
title_sort |
characterization of semiconductor heterostructures |
publishDate |
2012 |
url |
http://hdl.handle.net/10356/49550 |
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1772828952041095168 |