Characterization of semiconductor heterostructures
Strain accelerated HF etching is a process which allows for the separation of an intermediate layer in an aqueous acidic solution. The key idea behind this etching method is to induce tensile strain on the material which will subsequently improve the rate of etching. The initial stage of this projec...
Saved in:
主要作者: | Wong, Qihao. |
---|---|
其他作者: | Yoon Soon Fatt |
格式: | Final Year Project |
語言: | English |
出版: |
2012
|
主題: | |
在線閱讀: | http://hdl.handle.net/10356/49550 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
相似書籍
-
Characterization of narrow bandgap semiconductors
由: Ding, Xiao Ting
出版: (2012) -
Characterization techniques for power semiconductor and magnetic drives
由: Tseng, King Jet, et al.
出版: (2008) -
Characterization of compound semiconductor for quantum well infrared photodetectors
由: Zhang, Dao Hua
出版: (2008) -
Low dimensional semiconductor structures MOCVD growth and their characterizations
由: Song, Yi Fei.
出版: (2008) -
Scanning capacitance microscopy and related technologies for semiconductor device characterizations
由: Jiang, Yaoyao
出版: (2008)