De-embedding techniques for characterizing high frequency noise in nanometre CMOS devices

• المؤلف الرئيسي: Loo, Xi Sung.
• مؤلفون آخرون: Yeo Kiat Seng
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2012
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/49986
• المؤسسة: Nanyang Technological University

Aggressive scaling of CMOS devices over the past decades has enabled System-on-Chip (SoC) solution which permits full integration of digital circuits with analog and RF functions in one chip at low cost. However, the growing complexity of radio frequency integrated circuits requires accurate charact...