De-embedding techniques for characterizing high frequency noise in nanometre CMOS devices

• 主要作者: Loo, Xi Sung.
• 其他作者: Yeo Kiat Seng
• 格式: Theses and Dissertations
• 語言: English
• 出版: 2012
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
• 在線閱讀: http://hdl.handle.net/10356/49986
• 機構: Nanyang Technological University

Aggressive scaling of CMOS devices over the past decades has enabled System-on-Chip (SoC) solution which permits full integration of digital circuits with analog and RF functions in one chip at low cost. However, the growing complexity of radio frequency integrated circuits requires accurate charact...