Application of chemical mechanical polishing for sub-micron semiconductor device fabrication

This project investigated the process parameters, polishing consumables and pattern density dependencies in shallow trench isolation process performance.

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Bibliographic Details
Main Author: Goh, Hua Kooi.
Other Authors: Higelin, Gerald
Format: Theses and Dissertations
Language:English
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/5050
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Institution: Nanyang Technological University
Language: English