Dynamic bias-temperature instability study of metal/high-K gate stacks

In summary, a systematic study on the dynamic BTI of the metal/high-k gate stacks is conducted. The evolution of the switching oxide traps under the NBT and PBT stressing are compared and the possible oxygen defect framework is proposed. The frequency dependence of the BTI recovery is also examin...

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Bibliographic Details
Main Author: Gao, Yuan
Other Authors: Ang Diing Shenp
Format: Theses and Dissertations
Language:English
Published: 2014
Subjects:
Online Access:http://hdl.handle.net/10356/55583
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Institution: Nanyang Technological University
Language: English
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Summary:In summary, a systematic study on the dynamic BTI of the metal/high-k gate stacks is conducted. The evolution of the switching oxide traps under the NBT and PBT stressing are compared and the possible oxygen defect framework is proposed. The frequency dependence of the BTI recovery is also examined. Implications of these new experimental observations on the device reliability assessment and modeling are discussed.