Logic-compatible embedded dynamic random access memory design
Nowadays, EDRAMs become a new direction in the research society since it has higher density. However, poor data retention time due to small storage capacitor and various leakage paths has become the main issue, which results in high power consumption and poor read performance. In this FYP, the autho...
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格式: | Final Year Project |
語言: | English |
出版: |
2014
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在線閱讀: | http://hdl.handle.net/10356/60378 |
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機構: | Nanyang Technological University |
語言: | English |