Logic-compatible embedded dynamic random access memory design

Nowadays, EDRAMs become a new direction in the research society since it has higher density. However, poor data retention time due to small storage capacitor and various leakage paths has become the main issue, which results in high power consumption and poor read performance. In this FYP, the autho...

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書目詳細資料
主要作者: Wang, Yue
其他作者: Kim Tae Hyoung, Tony
格式: Final Year Project
語言:English
出版: 2014
主題:
在線閱讀:http://hdl.handle.net/10356/60378
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機構: Nanyang Technological University
語言: English