Logic-compatible embedded dynamic random access memory design

Nowadays, EDRAMs become a new direction in the research society since it has higher density. However, poor data retention time due to small storage capacitor and various leakage paths has become the main issue, which results in high power consumption and poor read performance. In this FYP, the autho...

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Bibliographic Details
Main Author: Wang, Yue
Other Authors: Kim Tae Hyoung, Tony
Format: Final Year Project
Language:English
Published: 2014
Subjects:
Online Access:http://hdl.handle.net/10356/60378
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Institution: Nanyang Technological University
Language: English
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