Simulation and characterization of the process and circuit of the MOSFET device with ISRC structure
The main objectives of this project are examining and elucidating unique features of Ultra thin film MOSFET by TCAD tools and providing useful understanding and data that could be used in MOS device and circuit design and optimization for high performance, low voltage/power ICes.
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2008
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Online Access: | http://hdl.handle.net/10356/6785 |
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sg-ntu-dr.10356-67852020-05-29T04:56:30Z Simulation and characterization of the process and circuit of the MOSFET device with ISRC structure Lee, Yong Kuen. School of Materials Science & Engineering DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films The main objectives of this project are examining and elucidating unique features of Ultra thin film MOSFET by TCAD tools and providing useful understanding and data that could be used in MOS device and circuit design and optimization for high performance, low voltage/power ICes. RG 6/98 2008-09-17T14:24:50Z 2008-09-17T14:24:50Z 2001 2001 Research Report http://hdl.handle.net/10356/6785 Nanyang Technological University 98 p. application/pdf |
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DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films Lee, Yong Kuen. Simulation and characterization of the process and circuit of the MOSFET device with ISRC structure |
description |
The main objectives of this project are examining and elucidating unique features of Ultra thin film MOSFET by TCAD tools and providing useful understanding and data that could be used in MOS device and circuit design and optimization for high performance, low voltage/power ICes. |
author2 |
School of Materials Science & Engineering |
author_facet |
School of Materials Science & Engineering Lee, Yong Kuen. |
format |
Research Report |
author |
Lee, Yong Kuen. |
author_sort |
Lee, Yong Kuen. |
title |
Simulation and characterization of the process and circuit of the MOSFET device with ISRC structure |
title_short |
Simulation and characterization of the process and circuit of the MOSFET device with ISRC structure |
title_full |
Simulation and characterization of the process and circuit of the MOSFET device with ISRC structure |
title_fullStr |
Simulation and characterization of the process and circuit of the MOSFET device with ISRC structure |
title_full_unstemmed |
Simulation and characterization of the process and circuit of the MOSFET device with ISRC structure |
title_sort |
simulation and characterization of the process and circuit of the mosfet device with isrc structure |
publishDate |
2008 |
url |
http://hdl.handle.net/10356/6785 |
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1681056280490278912 |