Setup and implementation of hierarchical scan insertion using the core wrapping technique

The rapid shrinking of the technology node from deep submicron levels to 90nm and below has allowed the complexity of the designs to increase without significantly increasing the chip size. Large designs are now posing many challenges to all design disciplines including design-for-test (DFT). For a...

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書目詳細資料
主要作者: Saurabh, Maru
其他作者: Gwee Bah Hwee
格式: Theses and Dissertations
語言:English
出版: 2018
主題:
在線閱讀:http://hdl.handle.net/10356/76078
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機構: Nanyang Technological University
語言: English