Investigation of gate leakage current mechanism in AlGaN/GaN high-electron-mobility transistors with sputtered TiN

• Main Authors: Li, Yang, Ng, Geok Ing, Arulkumaran, Subramaniam, Ye, Gang, Liu, Zhi Hong, Ranjan, Kumud, Ang, Kian Siong
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2017
• Subjects: Leakage currents; Temperature measurement
• Online Access: https://hdl.handle.net/10356/83338; http://hdl.handle.net/10220/42576
• Institution: Nanyang Technological University

The gate leakage current mechanism of AlGaN/GaN Schottky barrier diodes (SBDs) and high-electron-mobility transistors (HEMTs) with sputtered TiN is systematically investigated. The reverse leakage current (JR) of TiN SBDs increases exponentially with the increase of reverse voltage (VR) from 0 to −3.2 V (Reg. I). This conduction behavior is dominated by Poole-Frenkel emission from TiN through an interface state of 0.53 eV to the conductive dislocation-related continuum states. The obtained interface state of 0.53 eV may be due to the plasma damage to the surface of the AlGaN/GaN HEMT structure during the TiN sputtering. When the TiN SBDs are biased with −20 < VR < −3.2 V, JR saturated due to the depletion of the 2-dimensional electron gas (2DEG) channel (Reg. II). This conduction behavior is dominated by the trap-assisted tunneling through the interface state at ∼0.115 eV above the Fermi level. The three terminal OFF-state gate leakage current of AlGaN/GaN HEMTs exhibited an activation energy of 0.159 eV, which is in close agreement with the obtained interface state of ∼0.115 eV from saturated JR (Reg. II) of the SBDs. The observation of the negative temperature coefficient (−1.75 V/K) from the OFF-state breakdown voltage (at 1 μA/mm) of AlGaN/GaN HEMTs is due to the trap-assisted tunneling mechanism, which is also well correlated with the conduction mechanism realized from the reverse leakage current of the SBDs.