Transient electrical thermal analysis of ESD process using 3-D finite element method

• Main Authors: Hou, Yuejin, Tan, Cher Ming
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Conference or Workshop Item
• 語言: English
• 出版: 2010
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation
• 在線閱讀: https://hdl.handle.net/10356/91545; http://hdl.handle.net/10220/6395; http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5403933
• 機構: Nanyang Technological University

In this work, the transient electrical-thermal response of a simple ESD protection circuit to excessive current during an electrostatic discharge (ESD) event is investigated numerically, using 3-D finite element analysis (FEA). The 3-D tran...