A fast non-Monte-Carlo yield analysis and optimization by stochastic orthogonal polynomials

• Main Authors: Tan, Sheldon X. D., Ren, Junyan, He, Lei, Gong, Fang, Liu, Xuexin, Yu, Hao
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2012
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/95526; http://hdl.handle.net/10220/8763
• Institution: Nanyang Technological University

Performance failure has become a significant threat to the reliability and robustness of analog circuits. In this article, we first develop an efficient non-Monte-Carlo (NMC) transient mismatch analysis, where transient response is represented by stochastic orthogonal polynomial (SOP) expansion unde...