A fast non-Monte-Carlo yield analysis and optimization by stochastic orthogonal polynomials

• المؤلفون الرئيسيون: Tan, Sheldon X. D., Ren, Junyan, He, Lei, Gong, Fang, Liu, Xuexin, Yu, Hao
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2012
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/95526; http://hdl.handle.net/10220/8763

Performance failure has become a significant threat to the reliability and robustness of analog circuits. In this article, we first develop an efficient non-Monte-Carlo (NMC) transient mismatch analysis, where transient response is represented by stochastic orthogonal polynomial (SOP) expansion unde...