A fast non-Monte-Carlo yield analysis and optimization by stochastic orthogonal polynomials

Performance failure has become a significant threat to the reliability and robustness of analog circuits. In this article, we first develop an efficient non-Monte-Carlo (NMC) transient mismatch analysis, where transient response is represented by stochastic orthogonal polynomial (SOP) expansion unde...

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Bibliographic Details
Main Authors: Tan, Sheldon X. D., Ren, Junyan, He, Lei, Gong, Fang, Liu, Xuexin, Yu, Hao
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2012
Subjects:
Online Access:https://hdl.handle.net/10356/95526
http://hdl.handle.net/10220/8763
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Institution: Nanyang Technological University
Language: English
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