A fast non-Monte-Carlo yield analysis and optimization by stochastic orthogonal polynomials
Performance failure has become a significant threat to the reliability and robustness of analog circuits. In this article, we first develop an efficient non-Monte-Carlo (NMC) transient mismatch analysis, where transient response is represented by stochastic orthogonal polynomial (SOP) expansion unde...
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Main Authors: | Tan, Sheldon X. D., Ren, Junyan, He, Lei, Gong, Fang, Liu, Xuexin, Yu, Hao |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Article |
Language: | English |
Published: |
2012
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/95526 http://hdl.handle.net/10220/8763 |
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Institution: | Nanyang Technological University |
Language: | English |
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