ICMAT 2011 : Reliability and variability of semiconductor devices and ICs

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Bibliographic Details
Main Authors:	Asenov, Asen, Schlichtmann, Ulf, Tan, Cher Ming, Wong, Hei, Zhou, Xing
Other Authors:	School of Electrical and Electronic Engineering
Format:	Article
Language:	English
Published:	2013
Subjects:	DRNTU::Engineering::Electrical and electronic engineering
Online Access:	https://hdl.handle.net/10356/97814 http://hdl.handle.net/10220/11112
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Institution:	Nanyang Technological University
Language:	English

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Summary:	Abstract not available in fulltext.

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