ICMAT 2011 : Reliability and variability of semiconductor devices and ICs

ICMAT 2011 : Reliability and variability of semiconductor devices and ICs

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Bibliographic Details
Main Authors: Asenov, Asen, Schlichtmann, Ulf, Tan, Cher Ming, Wong, Hei, Zhou, Xing
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2013
Subjects:
DRNTU::Engineering::Electrical and electronic engineering
Online Access:https://hdl.handle.net/10356/97814
http://hdl.handle.net/10220/11112
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Institution: Nanyang Technological University
Language: English

Internet

https://hdl.handle.net/10356/97814
http://hdl.handle.net/10220/11112

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