ICMAT 2011 : Reliability and variability of semiconductor devices and ICs

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Main Authors:	Asenov, Asen, Schlichtmann, Ulf, Tan, Cher Ming, Wong, Hei, Zhou, Xing
Other Authors:	School of Electrical and Electronic Engineering
Format:	Article
Language:	English
Published:	2013
Subjects:	DRNTU::Engineering::Electrical and electronic engineering
Online Access:	https://hdl.handle.net/10356/97814 http://hdl.handle.net/10220/11112
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Institution:	Nanyang Technological University
Language:	English

id	sg-ntu-dr.10356-97814
record_format	dspace
spelling	sg-ntu-dr.10356-978142020-03-07T14:02:43Z ICMAT 2011 : Reliability and variability of semiconductor devices and ICs Asenov, Asen Schlichtmann, Ulf Tan, Cher Ming Wong, Hei Zhou, Xing School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering Abstract not available in fulltext. 2013-07-10T06:46:15Z 2019-12-06T19:47:01Z 2013-07-10T06:46:15Z 2019-12-06T19:47:01Z 2012 2012 Journal Article https://hdl.handle.net/10356/97814 http://hdl.handle.net/10220/11112 10.1016/j.microrel.2012.05.003 en Microelectronics reliability © 2012 Elsevier Ltd.
institution	Nanyang Technological University
building	NTU Library
country	Singapore
collection	DR-NTU
language	English
topic	DRNTU::Engineering::Electrical and electronic engineering
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering Asenov, Asen Schlichtmann, Ulf Tan, Cher Ming Wong, Hei Zhou, Xing ICMAT 2011 : Reliability and variability of semiconductor devices and ICs
description	Abstract not available in fulltext.
author2	School of Electrical and Electronic Engineering
author_facet	School of Electrical and Electronic Engineering Asenov, Asen Schlichtmann, Ulf Tan, Cher Ming Wong, Hei Zhou, Xing
format	Article
author	Asenov, Asen Schlichtmann, Ulf Tan, Cher Ming Wong, Hei Zhou, Xing
author_sort	Asenov, Asen
title	ICMAT 2011 : Reliability and variability of semiconductor devices and ICs
title_short	ICMAT 2011 : Reliability and variability of semiconductor devices and ICs
title_full	ICMAT 2011 : Reliability and variability of semiconductor devices and ICs
title_fullStr	ICMAT 2011 : Reliability and variability of semiconductor devices and ICs
title_full_unstemmed	ICMAT 2011 : Reliability and variability of semiconductor devices and ICs
title_sort	icmat 2011 : reliability and variability of semiconductor devices and ics
publishDate	2013
url	https://hdl.handle.net/10356/97814 http://hdl.handle.net/10220/11112
_version_	1681035225348440064

ICMAT 2011 : Reliability and variability of semiconductor devices and ICs

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