ICMAT 2011 : Reliability and variability of semiconductor devices and ICs

• Main Authors: Asenov, Asen, Schlichtmann, Ulf, Tan, Cher Ming, Wong, Hei, Zhou, Xing
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/97814; http://hdl.handle.net/10220/11112
• Institution: Nanyang Technological University

Abstract not available in fulltext.