ICMAT 2011 : Reliability and variability of semiconductor devices and ICs

ICMAT 2011 : Reliability and variability of semiconductor devices and ICs

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書目詳細資料
Main Authors:	Asenov, Asen, Schlichtmann, Ulf, Tan, Cher Ming, Wong, Hei, Zhou, Xing
其他作者:	School of Electrical and Electronic Engineering
格式:	Article
語言:	English
出版:	2013
主題:	DRNTU::Engineering::Electrical and electronic engineering
在線閱讀:	https://hdl.handle.net/10356/97814 http://hdl.handle.net/10220/11112
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	Nanyang Technological University
語言:	English

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