ICMAT 2011 : Reliability and variability of semiconductor devices and ICs

• Main Authors: Asenov, Asen, Schlichtmann, Ulf, Tan, Cher Ming, Wong, Hei, Zhou, Xing
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2013
• 主題: DRNTU::Engineering::Electrical and electronic engineering
• 在線閱讀: https://hdl.handle.net/10356/97814; http://hdl.handle.net/10220/11112

Abstract not available in fulltext.