Neighborhood repulsed metric learning for kinship verification

• Main Authors: Lu, Jiwen, Hu, Junlin, Zhou, Xiuzhuang, Shang, Yuanyuan, Tan, Yap Peng, Wang, Gang
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/98388; http://hdl.handle.net/10220/12489
• Institution: Nanyang Technological University

Kinship verification from facial images is a challenging problem in computer vision, and there is a very few attempts on tackling this problem in the literature. In this paper, we propose a new neighborhood repulsed metric learning (NRML) method for kinship verification. Motivated by the fact that i...