High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials
Materials Science Forum
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2014
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sg-nus-scholar.10635-1070612015-01-31T02:33:14Z High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials Xu, G. Feng, Z.C. MATERIALS SCIENCE Materials Science Forum 338 I/- MSFOE 2014-10-29T08:38:57Z 2014-10-29T08:38:57Z 2000 Article Xu, G.,Feng, Z.C. (2000). High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials. Materials Science Forum 338 : I/-. ScholarBank@NUS Repository. 02555476 http://scholarbank.nus.edu.sg/handle/10635/107061 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
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ScholarBank@NUS |
| description |
Materials Science Forum |
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MATERIALS SCIENCE |
| author_facet |
MATERIALS SCIENCE Xu, G. Feng, Z.C. |
| format |
Article |
| author |
Xu, G. Feng, Z.C. |
| spellingShingle |
Xu, G. Feng, Z.C. High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials |
| author_sort |
Xu, G. |
| title |
High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials |
| title_short |
High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials |
| title_full |
High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials |
| title_fullStr |
High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials |
| title_full_unstemmed |
High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials |
| title_sort |
high order x-ray diffraction and internal atomic layer roughness of epitaxial and bulk sic materials |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/107061 |
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1681093576558116864 |