Orientation anomalies in plating thickness measurements from advanced packaging substrates

10.1088/0268-1242/11/3/026

Saved in:
Bibliographic Details
Main Authors: Tan, N.X., Lee, A.J.Y., Bourdillon, A.J., Tan, C.Y.S.
Other Authors: MATERIALS SCIENCE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/107154
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Be the first to leave a comment!
You must be logged in first