Effect of oxide field on hot carrier induced degradation in CMOS gate oxide
Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA
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sg-nus-scholar.10635-1129762024-11-14T18:45:32Z Effect of oxide field on hot carrier induced degradation in CMOS gate oxide Zhao, S.P. Taylor, S. INSTITUTE OF MICROELECTRONICS Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA 91-95 234 2014-11-28T08:12:54Z 2014-11-28T08:12:54Z 1995 Conference Paper Zhao, S.P.,Taylor, S. (1995). Effect of oxide field on hot carrier induced degradation in CMOS gate oxide. Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA : 91-95. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/112976 NOT_IN_WOS Scopus |
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Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA |
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INSTITUTE OF MICROELECTRONICS |
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INSTITUTE OF MICROELECTRONICS Zhao, S.P. Taylor, S. |
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Conference or Workshop Item |
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Zhao, S.P. Taylor, S. |
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Zhao, S.P. Taylor, S. Effect of oxide field on hot carrier induced degradation in CMOS gate oxide |
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Zhao, S.P. |
title |
Effect of oxide field on hot carrier induced degradation in CMOS gate oxide |
title_short |
Effect of oxide field on hot carrier induced degradation in CMOS gate oxide |
title_full |
Effect of oxide field on hot carrier induced degradation in CMOS gate oxide |
title_fullStr |
Effect of oxide field on hot carrier induced degradation in CMOS gate oxide |
title_full_unstemmed |
Effect of oxide field on hot carrier induced degradation in CMOS gate oxide |
title_sort |
effect of oxide field on hot carrier induced degradation in cmos gate oxide |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/112976 |
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