Effect of oxide field on hot carrier induced degradation in CMOS gate oxide

Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA

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Main Authors: Zhao, S.P., Taylor, S.
Other Authors: INSTITUTE OF MICROELECTRONICS
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/112976
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1129762024-11-14T18:45:32Z Effect of oxide field on hot carrier induced degradation in CMOS gate oxide Zhao, S.P. Taylor, S. INSTITUTE OF MICROELECTRONICS Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA 91-95 234 2014-11-28T08:12:54Z 2014-11-28T08:12:54Z 1995 Conference Paper Zhao, S.P.,Taylor, S. (1995). Effect of oxide field on hot carrier induced degradation in CMOS gate oxide. Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA : 91-95. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/112976 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA
author2 INSTITUTE OF MICROELECTRONICS
author_facet INSTITUTE OF MICROELECTRONICS
Zhao, S.P.
Taylor, S.
format Conference or Workshop Item
author Zhao, S.P.
Taylor, S.
spellingShingle Zhao, S.P.
Taylor, S.
Effect of oxide field on hot carrier induced degradation in CMOS gate oxide
author_sort Zhao, S.P.
title Effect of oxide field on hot carrier induced degradation in CMOS gate oxide
title_short Effect of oxide field on hot carrier induced degradation in CMOS gate oxide
title_full Effect of oxide field on hot carrier induced degradation in CMOS gate oxide
title_fullStr Effect of oxide field on hot carrier induced degradation in CMOS gate oxide
title_full_unstemmed Effect of oxide field on hot carrier induced degradation in CMOS gate oxide
title_sort effect of oxide field on hot carrier induced degradation in cmos gate oxide
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/112976
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