Behaviour of ionized metal plasma deposited Ta diffusion barrier between Cu and SiO2
10.1023/A:1015230727381
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sg-nus-scholar.10635-1130712015-01-20T10:06:32Z Behaviour of ionized metal plasma deposited Ta diffusion barrier between Cu and SiO2 Maung Latt, K. Park, H.S. Li, S. Rong, L. Osipowicz, T. Zhu, W.G. Lee, Y.K. PHYSICS INSTITUTE OF ENGINEERING SCIENCE 10.1023/A:1015230727381 Journal of Materials Science 37 10 1941-1949 JMTSA 2014-11-28T09:11:38Z 2014-11-28T09:11:38Z 2002-05-15 Article Maung Latt, K.,Park, H.S.,Li, S.,Rong, L.,Osipowicz, T.,Zhu, W.G.,Lee, Y.K. (2002-05-15). Behaviour of ionized metal plasma deposited Ta diffusion barrier between Cu and SiO2. Journal of Materials Science 37 (10) : 1941-1949. ScholarBank@NUS Repository. <a href="https://doi.org/10.1023/A:1015230727381" target="_blank">https://doi.org/10.1023/A:1015230727381</a> 00222461 http://scholarbank.nus.edu.sg/handle/10635/113071 NOT_IN_WOS Scopus |
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PHYSICS Maung Latt, K. Park, H.S. Li, S. Rong, L. Osipowicz, T. Zhu, W.G. Lee, Y.K. |
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Maung Latt, K. Park, H.S. Li, S. Rong, L. Osipowicz, T. Zhu, W.G. Lee, Y.K. |
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Maung Latt, K. Park, H.S. Li, S. Rong, L. Osipowicz, T. Zhu, W.G. Lee, Y.K. Behaviour of ionized metal plasma deposited Ta diffusion barrier between Cu and SiO2 |
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Maung Latt, K. |
title |
Behaviour of ionized metal plasma deposited Ta diffusion barrier between Cu and SiO2 |
title_short |
Behaviour of ionized metal plasma deposited Ta diffusion barrier between Cu and SiO2 |
title_full |
Behaviour of ionized metal plasma deposited Ta diffusion barrier between Cu and SiO2 |
title_fullStr |
Behaviour of ionized metal plasma deposited Ta diffusion barrier between Cu and SiO2 |
title_full_unstemmed |
Behaviour of ionized metal plasma deposited Ta diffusion barrier between Cu and SiO2 |
title_sort |
behaviour of ionized metal plasma deposited ta diffusion barrier between cu and sio2 |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/113071 |
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1681094598150062080 |