Characterization of interfacial reactions between ionized metal plasma deposited Al-0.5 wt.% Cu and Ti on SiO2

10.1016/S0921-5107(00)00481-5

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Bibliographic Details
Main Authors: Lee, Y.K., Maung Latt, K., Li, S., Osipowicz, T., Chiam, S.Y.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/95961
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Institution: National University of Singapore