Investigation of boron penetration through decoupled plasma nitrided gate oxide using backside secondary ion mass spectrometry depth profiling

10.1116/1.1535925

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Bibliographic Details
Main Authors: Yeo, K.L., Wee, A.T.S., Liu, R., Zhou, F.F., See, A.
Other Authors: INSTITUTE OF ENGINEERING SCIENCE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/113085
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Institution: National University of Singapore
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