Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits

• Main Authors: Shen, C., Yang, T., Li, M.-F., Samudra, G., Yeo, Y.-C., Zhu, C.X., Rustagi, S.C., Yut, M.B., Kwong, D.-L.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/114559
• Institution: National University of Singapore

10.1109/RELPHY.2006.251308