Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits

10.1109/RELPHY.2006.251308

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Bibliographic Details
Main Authors:	Shen, C., Yang, T., Li, M.-F., Samudra, G., Yeo, Y.-C., Zhu, C.X., Rustagi, S.C., Yut, M.B., Kwong, D.-L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/114559
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-114559
record_format	dspace
spelling	sg-nus-scholar.10635-1145592023-10-30T09:02:46Z Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits Shen, C. Yang, T. Li, M.-F. Samudra, G. Yeo, Y.-C. Zhu, C.X. Rustagi, S.C. Yut, M.B. Kwong, D.-L. ELECTRICAL & COMPUTER ENGINEERING 10.1109/RELPHY.2006.251308 IEEE International Reliability Physics Symposium Proceedings 653-654 2014-12-02T08:06:02Z 2014-12-02T08:06:02Z 2006 Conference Paper Shen, C., Yang, T., Li, M.-F., Samudra, G., Yeo, Y.-C., Zhu, C.X., Rustagi, S.C., Yut, M.B., Kwong, D.-L. (2006). Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits. IEEE International Reliability Physics Symposium Proceedings : 653-654. ScholarBank@NUS Repository. https://doi.org/10.1109/RELPHY.2006.251308 0780394992 15417026 http://scholarbank.nus.edu.sg/handle/10635/114559 000240855800123 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1109/RELPHY.2006.251308
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Shen, C. Yang, T. Li, M.-F. Samudra, G. Yeo, Y.-C. Zhu, C.X. Rustagi, S.C. Yut, M.B. Kwong, D.-L.
format	Conference or Workshop Item
author	Shen, C. Yang, T. Li, M.-F. Samudra, G. Yeo, Y.-C. Zhu, C.X. Rustagi, S.C. Yut, M.B. Kwong, D.-L.
spellingShingle	Shen, C. Yang, T. Li, M.-F. Samudra, G. Yeo, Y.-C. Zhu, C.X. Rustagi, S.C. Yut, M.B. Kwong, D.-L. Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits
author_sort	Shen, C.
title	Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits
title_short	Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits
title_full	Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits
title_fullStr	Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits
title_full_unstemmed	Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits
title_sort	fast vth instability in hfo2 gate dielectric mosfets and its impact on digital circuits
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/114559
_version_	1781789292874432512

Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits

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