Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation
10.1021/ja049560e
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sg-nus-scholar.10635-1152442023-10-26T09:14:53Z Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation Xie, X.N. Chung, H.J. Xu, H. Xu, X. Sow, C.H. Wee, A.T.S. PHYSICS INSTITUTE OF ENGINEERING SCIENCE NUS NANOSCIENCE & NANOTECH INITIATIVE TEMASEK LABORATORIES 10.1021/ja049560e Journal of the American Chemical Society 126 24 7665-7675 JACSA 2014-12-12T07:12:58Z 2014-12-12T07:12:58Z 2004-06-23 Article Xie, X.N., Chung, H.J., Xu, H., Xu, X., Sow, C.H., Wee, A.T.S. (2004-06-23). Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation. Journal of the American Chemical Society 126 (24) : 7665-7675. ScholarBank@NUS Repository. https://doi.org/10.1021/ja049560e 00027863 http://scholarbank.nus.edu.sg/handle/10635/115244 000222120900047 Scopus |
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PHYSICS Xie, X.N. Chung, H.J. Xu, H. Xu, X. Sow, C.H. Wee, A.T.S. |
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Xie, X.N. Chung, H.J. Xu, H. Xu, X. Sow, C.H. Wee, A.T.S. |
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Xie, X.N. Chung, H.J. Xu, H. Xu, X. Sow, C.H. Wee, A.T.S. Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation |
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Xie, X.N. |
title |
Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation |
title_short |
Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation |
title_full |
Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation |
title_fullStr |
Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation |
title_full_unstemmed |
Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation |
title_sort |
probe-induced native oxide decomposition and localized oxidation on 6h-sic (0001) surface: an atomic force microscopy investigation |
publishDate |
2014 |
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http://scholarbank.nus.edu.sg/handle/10635/115244 |
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1781789368520802304 |