Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation

10.1021/ja049560e

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Main Authors: Xie, X.N., Chung, H.J., Xu, H., Xu, X., Sow, C.H., Wee, A.T.S.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/115244
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1152442023-10-26T09:14:53Z Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation Xie, X.N. Chung, H.J. Xu, H. Xu, X. Sow, C.H. Wee, A.T.S. PHYSICS INSTITUTE OF ENGINEERING SCIENCE NUS NANOSCIENCE & NANOTECH INITIATIVE TEMASEK LABORATORIES 10.1021/ja049560e Journal of the American Chemical Society 126 24 7665-7675 JACSA 2014-12-12T07:12:58Z 2014-12-12T07:12:58Z 2004-06-23 Article Xie, X.N., Chung, H.J., Xu, H., Xu, X., Sow, C.H., Wee, A.T.S. (2004-06-23). Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation. Journal of the American Chemical Society 126 (24) : 7665-7675. ScholarBank@NUS Repository. https://doi.org/10.1021/ja049560e 00027863 http://scholarbank.nus.edu.sg/handle/10635/115244 000222120900047 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1021/ja049560e
author2 PHYSICS
author_facet PHYSICS
Xie, X.N.
Chung, H.J.
Xu, H.
Xu, X.
Sow, C.H.
Wee, A.T.S.
format Article
author Xie, X.N.
Chung, H.J.
Xu, H.
Xu, X.
Sow, C.H.
Wee, A.T.S.
spellingShingle Xie, X.N.
Chung, H.J.
Xu, H.
Xu, X.
Sow, C.H.
Wee, A.T.S.
Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation
author_sort Xie, X.N.
title Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation
title_short Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation
title_full Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation
title_fullStr Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation
title_full_unstemmed Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigation
title_sort probe-induced native oxide decomposition and localized oxidation on 6h-sic (0001) surface: an atomic force microscopy investigation
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/115244
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