Oxide growth and its dielectrical properties on alkylsilated native-SiO2/Si surface

10.1016/j.cplett.2004.02.097

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Bibliographic Details
Main Authors:	Xie, X.N., Chung, H.J., Sow, C.H., Wee, A.T.S.
Other Authors:	NUS NANOSCIENCE & NANOTECH INITIATIVE
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/115856
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-115856
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spelling	sg-nus-scholar.10635-1158562023-10-25T22:56:12Z Oxide growth and its dielectrical properties on alkylsilated native-SiO2/Si surface Xie, X.N. Chung, H.J. Sow, C.H. Wee, A.T.S. NUS NANOSCIENCE & NANOTECH INITIATIVE PHYSICS 10.1016/j.cplett.2004.02.097 Chemical Physics Letters 388 4-6 446-451 CHPLB 2014-12-12T07:33:20Z 2014-12-12T07:33:20Z 2004-04-21 Article Xie, X.N., Chung, H.J., Sow, C.H., Wee, A.T.S. (2004-04-21). Oxide growth and its dielectrical properties on alkylsilated native-SiO2/Si surface. Chemical Physics Letters 388 (4-6) : 446-451. ScholarBank@NUS Repository. https://doi.org/10.1016/j.cplett.2004.02.097 00092614 http://scholarbank.nus.edu.sg/handle/10635/115856 000220935600041 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1016/j.cplett.2004.02.097
author2	NUS NANOSCIENCE & NANOTECH INITIATIVE
author_facet	NUS NANOSCIENCE & NANOTECH INITIATIVE Xie, X.N. Chung, H.J. Sow, C.H. Wee, A.T.S.
format	Article
author	Xie, X.N. Chung, H.J. Sow, C.H. Wee, A.T.S.
spellingShingle	Xie, X.N. Chung, H.J. Sow, C.H. Wee, A.T.S. Oxide growth and its dielectrical properties on alkylsilated native-SiO2/Si surface
author_sort	Xie, X.N.
title	Oxide growth and its dielectrical properties on alkylsilated native-SiO2/Si surface
title_short	Oxide growth and its dielectrical properties on alkylsilated native-SiO2/Si surface
title_full	Oxide growth and its dielectrical properties on alkylsilated native-SiO2/Si surface
title_fullStr	Oxide growth and its dielectrical properties on alkylsilated native-SiO2/Si surface
title_full_unstemmed	Oxide growth and its dielectrical properties on alkylsilated native-SiO2/Si surface
title_sort	oxide growth and its dielectrical properties on alkylsilated native-sio2/si surface
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/115856
_version_	1781789443041001472

Oxide growth and its dielectrical properties on alkylsilated native-SiO2/Si surface

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