SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS

SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS

10.1109/JSSC.2015.2408332

Saved in:
Bibliographic Details
Main Authors: Frustaci, Fabio, Khayatzadeh, Mahmood, Blaauw, David T., Sylvester, Deenis M., Alioto, Massimo Bruno
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: Institute of Electrical and Electronics Engineers Inc. 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/123449
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Description
Summary:10.1109/JSSC.2015.2408332

Similar Items