SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS

• Main Authors: Frustaci, Fabio, Khayatzadeh, Mahmood, Blaauw, David T., Sylvester, Deenis M., Alioto, Massimo Bruno
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: Institute of Electrical and Electronics Engineers Inc. 2016
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/123449
• Institution: National University of Singapore

10.1109/JSSC.2015.2408332