SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS

SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS

10.1109/JSSC.2015.2408332

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Bibliographic Details
Main Authors:	Frustaci, Fabio, Khayatzadeh, Mahmood, Blaauw, David T., Sylvester, Deenis M., Alioto, Massimo Bruno
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	Institute of Electrical and Electronics Engineers Inc. 2016
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/123449
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

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