SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS
10.1109/JSSC.2015.2408332
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2016
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sg-nus-scholar.10635-1234492023-10-27T07:09:35Z SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS Frustaci, Fabio Khayatzadeh, Mahmood Blaauw, David T. Sylvester, Deenis M. Alioto, Massimo Bruno ELECTRICAL & COMPUTER ENGINEERING 10.1109/JSSC.2015.2408332 IEEE Journal of Solid-State Circuits 50 5 1310-1323 2016-04-29T06:06:19Z 2016-04-29T06:06:19Z 2015 Article Frustaci, Fabio, Khayatzadeh, Mahmood, Blaauw, David T., Sylvester, Deenis M., Alioto, Massimo Bruno (2015). SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS. IEEE Journal of Solid-State Circuits 50 (5) : 1310-1323. ScholarBank@NUS Repository. https://doi.org/10.1109/JSSC.2015.2408332 00189200 http://scholarbank.nus.edu.sg/handle/10635/123449 000354186300021 Institute of Electrical and Electronics Engineers Inc. |
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Singapore Singapore |
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| description |
10.1109/JSSC.2015.2408332 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Frustaci, Fabio Khayatzadeh, Mahmood Blaauw, David T. Sylvester, Deenis M. Alioto, Massimo Bruno |
| format |
Article |
| author |
Frustaci, Fabio Khayatzadeh, Mahmood Blaauw, David T. Sylvester, Deenis M. Alioto, Massimo Bruno |
| spellingShingle |
Frustaci, Fabio Khayatzadeh, Mahmood Blaauw, David T. Sylvester, Deenis M. Alioto, Massimo Bruno SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS |
| author_sort |
Frustaci, Fabio |
| title |
SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS |
| title_short |
SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS |
| title_full |
SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS |
| title_fullStr |
SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS |
| title_full_unstemmed |
SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS |
| title_sort |
sram for error-tolerant applications with dynamic energy-quality management in 28 nm cmos |
| publisher |
Institute of Electrical and Electronics Engineers Inc. |
| publishDate |
2016 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/123449 |
| _version_ |
1781789774668890112 |