GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS

Master's

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Bibliographic Details
Main Author: CAO YU
Other Authors: SINGAPORE-MIT ALLIANCE
Format: Theses and Dissertations
Published: 2019
Subjects:
Online Access:https://scholarbank.nus.edu.sg/handle/10635/154026
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1540262019-05-10T13:16:12Z GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS CAO YU SINGAPORE-MIT ALLIANCE PEY KIN LEONG TUNG CHIH-HANG gate oxide dielectric breakdown dielectric breakdown induced epitaxy (DBIE) simulation Master's MASTER OF SCIENCE IN ADVANCED MATERIALS FOR MICRO- & NANO- SYSTEMS 2019-05-10T07:27:41Z 2019-05-10T07:27:41Z 2003 Thesis CAO YU (2003). GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/154026 SMA BATCHLOAD 20190422
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
topic gate oxide
dielectric breakdown
dielectric breakdown induced epitaxy (DBIE)
simulation
spellingShingle gate oxide
dielectric breakdown
dielectric breakdown induced epitaxy (DBIE)
simulation
CAO YU
GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS
description Master's
author2 SINGAPORE-MIT ALLIANCE
author_facet SINGAPORE-MIT ALLIANCE
CAO YU
format Theses and Dissertations
author CAO YU
author_sort CAO YU
title GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS
title_short GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS
title_full GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS
title_fullStr GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS
title_full_unstemmed GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS
title_sort gate dielectric breakdown - 2d modeling of the dbie impact on the device characteristics
publishDate 2019
url https://scholarbank.nus.edu.sg/handle/10635/154026
_version_ 1681099327311708160