GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS
Master's
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sg-nus-scholar.10635-1540262019-05-10T13:16:12Z GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS CAO YU SINGAPORE-MIT ALLIANCE PEY KIN LEONG TUNG CHIH-HANG gate oxide dielectric breakdown dielectric breakdown induced epitaxy (DBIE) simulation Master's MASTER OF SCIENCE IN ADVANCED MATERIALS FOR MICRO- & NANO- SYSTEMS 2019-05-10T07:27:41Z 2019-05-10T07:27:41Z 2003 Thesis CAO YU (2003). GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/154026 SMA BATCHLOAD 20190422 |
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topic |
gate oxide dielectric breakdown dielectric breakdown induced epitaxy (DBIE) simulation |
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gate oxide dielectric breakdown dielectric breakdown induced epitaxy (DBIE) simulation CAO YU GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS |
description |
Master's |
author2 |
SINGAPORE-MIT ALLIANCE |
author_facet |
SINGAPORE-MIT ALLIANCE CAO YU |
format |
Theses and Dissertations |
author |
CAO YU |
author_sort |
CAO YU |
title |
GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS |
title_short |
GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS |
title_full |
GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS |
title_fullStr |
GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS |
title_full_unstemmed |
GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS |
title_sort |
gate dielectric breakdown - 2d modeling of the dbie impact on the device characteristics |
publishDate |
2019 |
url |
https://scholarbank.nus.edu.sg/handle/10635/154026 |
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1681099327311708160 |