Exploring variability and reliability of multi-level STT-MRAM cells

10.1109/DRC.2012.6257003

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Bibliographic Details
Main Authors: Panagopoulos, G, Augustine, C, Fong, X, Roy, K
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: IEEE 2019
Online Access:https://scholarbank.nus.edu.sg/handle/10635/156209
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Institution: National University of Singapore