Exploring variability and reliability of multi-level STT-MRAM cells

10.1109/DRC.2012.6257003

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Bibliographic Details
Main Authors:	Panagopoulos, G, Augustine, C, Fong, X, Roy, K
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	IEEE 2019
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/156209
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Institution:	National University of Singapore

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