Exploring variability and reliability of multi-level STT-MRAM cells

Exploring variability and reliability of multi-level STT-MRAM cells

10.1109/DRC.2012.6257003

Saved in:
Bibliographic Details
Main Authors: Panagopoulos, G, Augustine, C, Fong, X, Roy, K
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: IEEE 2019
Online Access:https://scholarbank.nus.edu.sg/handle/10635/156209
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Description
Summary:10.1109/DRC.2012.6257003

Similar Items