Exploring variability and reliability of multi-level STT-MRAM cells
10.1109/DRC.2012.6257003
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Main Authors: | Panagopoulos, G, Augustine, C, Fong, X, Roy, K |
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Other Authors: | ELECTRICAL AND COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
IEEE
2019
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Online Access: | https://scholarbank.nus.edu.sg/handle/10635/156209 |
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Institution: | National University of Singapore |
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