Exploring variability and reliability of multi-level STT-MRAM cells
10.1109/DRC.2012.6257003
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sg-nus-scholar.10635-1562092024-04-16T11:52:16Z Exploring variability and reliability of multi-level STT-MRAM cells Panagopoulos, G Augustine, C Fong, X Roy, K ELECTRICAL AND COMPUTER ENGINEERING 10.1109/DRC.2012.6257003 2012 70th Annual Device Research Conference (DRC) 139-140 2019-07-03T04:01:54Z 2019-07-03T04:01:54Z 2012-10-05 2019-07-03T03:46:50Z Conference Paper Panagopoulos, G, Augustine, C, Fong, X, Roy, K (2012-10-05). Exploring variability and reliability of multi-level STT-MRAM cells. 2012 70th Annual Device Research Conference (DRC) : 139-140. ScholarBank@NUS Repository. https://doi.org/10.1109/DRC.2012.6257003 9781467311618 15483770 https://scholarbank.nus.edu.sg/handle/10635/156209 IEEE Elements |
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10.1109/DRC.2012.6257003 |
author2 |
ELECTRICAL AND COMPUTER ENGINEERING |
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ELECTRICAL AND COMPUTER ENGINEERING Panagopoulos, G Augustine, C Fong, X Roy, K |
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Conference or Workshop Item |
author |
Panagopoulos, G Augustine, C Fong, X Roy, K |
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Panagopoulos, G Augustine, C Fong, X Roy, K Exploring variability and reliability of multi-level STT-MRAM cells |
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Panagopoulos, G |
title |
Exploring variability and reliability of multi-level STT-MRAM cells |
title_short |
Exploring variability and reliability of multi-level STT-MRAM cells |
title_full |
Exploring variability and reliability of multi-level STT-MRAM cells |
title_fullStr |
Exploring variability and reliability of multi-level STT-MRAM cells |
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Exploring variability and reliability of multi-level STT-MRAM cells |
title_sort |
exploring variability and reliability of multi-level stt-mram cells |
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IEEE |
publishDate |
2019 |
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https://scholarbank.nus.edu.sg/handle/10635/156209 |
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