Exploring variability and reliability of multi-level STT-MRAM cells

10.1109/DRC.2012.6257003

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Bibliographic Details
Main Authors: Panagopoulos, G, Augustine, C, Fong, X, Roy, K
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: IEEE 2019
Online Access:https://scholarbank.nus.edu.sg/handle/10635/156209
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1562092024-04-16T11:52:16Z Exploring variability and reliability of multi-level STT-MRAM cells Panagopoulos, G Augustine, C Fong, X Roy, K ELECTRICAL AND COMPUTER ENGINEERING 10.1109/DRC.2012.6257003 2012 70th Annual Device Research Conference (DRC) 139-140 2019-07-03T04:01:54Z 2019-07-03T04:01:54Z 2012-10-05 2019-07-03T03:46:50Z Conference Paper Panagopoulos, G, Augustine, C, Fong, X, Roy, K (2012-10-05). Exploring variability and reliability of multi-level STT-MRAM cells. 2012 70th Annual Device Research Conference (DRC) : 139-140. ScholarBank@NUS Repository. https://doi.org/10.1109/DRC.2012.6257003 9781467311618 15483770 https://scholarbank.nus.edu.sg/handle/10635/156209 IEEE Elements
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1109/DRC.2012.6257003
author2 ELECTRICAL AND COMPUTER ENGINEERING
author_facet ELECTRICAL AND COMPUTER ENGINEERING
Panagopoulos, G
Augustine, C
Fong, X
Roy, K
format Conference or Workshop Item
author Panagopoulos, G
Augustine, C
Fong, X
Roy, K
spellingShingle Panagopoulos, G
Augustine, C
Fong, X
Roy, K
Exploring variability and reliability of multi-level STT-MRAM cells
author_sort Panagopoulos, G
title Exploring variability and reliability of multi-level STT-MRAM cells
title_short Exploring variability and reliability of multi-level STT-MRAM cells
title_full Exploring variability and reliability of multi-level STT-MRAM cells
title_fullStr Exploring variability and reliability of multi-level STT-MRAM cells
title_full_unstemmed Exploring variability and reliability of multi-level STT-MRAM cells
title_sort exploring variability and reliability of multi-level stt-mram cells
publisher IEEE
publishDate 2019
url https://scholarbank.nus.edu.sg/handle/10635/156209
_version_ 1800913648033464320