A CORRELATION OF OXIDE TRAP DENSITY AND TDDB CHARACTERISTICS OF VERY THIN SIO2 FILMS

Master's

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Main Author: MERINNAGE TAMARA CHANDIMA PERERA
Other Authors: ELECTRICAL ENGINEERING
Format: Theses and Dissertations
Published: 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/182386
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1823862020-11-19T13:57:19Z A CORRELATION OF OXIDE TRAP DENSITY AND TDDB CHARACTERISTICS OF VERY THIN SIO2 FILMS MERINNAGE TAMARA CHANDIMA PERERA ELECTRICAL ENGINEERING W. S. LAU Master's MASTER OF ENGINEERING 2020-10-30T08:21:36Z 2020-10-30T08:21:36Z 1996 Thesis MERINNAGE TAMARA CHANDIMA PERERA (1996). A CORRELATION OF OXIDE TRAP DENSITY AND TDDB CHARACTERISTICS OF VERY THIN SIO2 FILMS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/182386 CCK BATCHLOAD 20201023
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Master's
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
MERINNAGE TAMARA CHANDIMA PERERA
format Theses and Dissertations
author MERINNAGE TAMARA CHANDIMA PERERA
spellingShingle MERINNAGE TAMARA CHANDIMA PERERA
A CORRELATION OF OXIDE TRAP DENSITY AND TDDB CHARACTERISTICS OF VERY THIN SIO2 FILMS
author_sort MERINNAGE TAMARA CHANDIMA PERERA
title A CORRELATION OF OXIDE TRAP DENSITY AND TDDB CHARACTERISTICS OF VERY THIN SIO2 FILMS
title_short A CORRELATION OF OXIDE TRAP DENSITY AND TDDB CHARACTERISTICS OF VERY THIN SIO2 FILMS
title_full A CORRELATION OF OXIDE TRAP DENSITY AND TDDB CHARACTERISTICS OF VERY THIN SIO2 FILMS
title_fullStr A CORRELATION OF OXIDE TRAP DENSITY AND TDDB CHARACTERISTICS OF VERY THIN SIO2 FILMS
title_full_unstemmed A CORRELATION OF OXIDE TRAP DENSITY AND TDDB CHARACTERISTICS OF VERY THIN SIO2 FILMS
title_sort correlation of oxide trap density and tddb characteristics of very thin sio2 films
publishDate 2020
url https://scholarbank.nus.edu.sg/handle/10635/182386
_version_ 1686109181405298688